MOURAD, S. (2000). PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley.
Cita Chicago (17th ed.)MOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. New York: John Wiley, 2000.
Cita MLA (9th ed.)MOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley, 2000.
Atenció: Aquestes cites poden no estar 100% correctes.