APA aipamena

MOURAD, S. (2000). PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley.

Chicago Style aipamena

MOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. New York: John Wiley, 2000.

MLA aipamena

MOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley, 2000.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.