MOURAD, S. (2000). PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley.
Citación estilo ChicagoMOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. New York: John Wiley, 2000.
Cita MLAMOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley, 2000.
Warning: These citations may not always be 100% accurate.