MOURAD, S. (2000). PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley.
Chicago Style (17th ed.) CitationMOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. New York: John Wiley, 2000.
MLA引文MOURAD, S. PRINCIPLES OF TESTING ELECTRONIC SYSTEMS. John Wiley, 2000.
警告:這些引文格式不一定是100%准確.